Young’s modulus measurement

YL Yunwoo Lee
SD Sreekantha Reddy Dugansani
SJ So Hee Jeon
SH Soon Hyoung Hwang
JK Jae-Hyun Kim
SP Sung Ha Park
JJ Jun-Ho Jeong
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The mechanical properties of a DNA film were characterised using nanoindentation (NanoIndenter XP; MTS, Eden Prairie, MN, USA) with a Berkovich diamond indenter. The Oliver–Pharr method was utilized to analyse the nanoindentation data to determine the representative modulus values with respect to the indentation depth55. The surface stiffness of the DNA film was measured based on the continuous stiffness measurement unit obtained using the NanoIndenter XP, and Poison’s ratio of DNA was assumed to be 0.3. The measured modulus was 5.39 GPa, which reflected the average value over a range of indentation depths from 100 to 200 nm. The tests were repeated in nine trials, using the same samples.

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