2.3.1. Field Emission Scanning Electron Microscopy (FESEM)

The CSLNs were observed using an FESEM H-7500 (Hitachi Ltd., Chiyoda, Tokyo, Japan) for determination of the shape, size, and any physical instability, i.e., aggregation or irregularity in the particles. The narrow probing beams of FESEM at low and high energies provide magnified spatial resolution with minimum sample damage. The topographical information is provided at magnifications ranging from 250 to 1,000,000× with ion-free pictures. A thin film of diluted CSLN dispersion was placed on the carbon-coated copper grid and dried before its observation under FESEM.