After recovering the DAC sample at ambient conditions, a cross-section at the center of the laser-heated portion was prepared parallel to the compression/laser-heating axis by using a dual-beam focused ion beam (FIB, Versa 3DTM, FEI). Textural observation and preliminary compositional characterization were made with a field-emission-type scanning electron microscope (FE-SEM) and an energy-dispersive X-ray spectrometer (EDS) with a silicon drift detector (Bruker) in the dual-beam FIB system (Supplementary Fig. 3).
Subsequently the hydrogen content in a quenched silicate melt was determined with an isotope microscope system installed at the Hokkaido University, which is composed of CAMECA IMS-1270 SIMS and a two-dimensional ion detector, SCAPS (stacked CMOS-type active pixel sensor)45. This system provides quantitative maps of secondary ions emitted from sample surface46,47 (Fig. 1b), because the CMOS sensor exhibits a good linear relationship between an output voltage and the number of secondary ions48). Therefore, we can quantify the abundance of each element from the intensity map.
Two-dimensional images of 1H+, 28Si+, and 40Ca+ with 0.5–1.2 µm spatial resolution for 1H+ were collected using the 16O− primary beam (13 keV, 37 nA) that was focused to 20–30 μm in diameter and rastered across a 100 μm × 100 μm region on the sample surface. We set the contrast aperture to be 100 μm in diameter with the exit slit fully opened. In order to minimize the effect of adsorbed water on the sample surface, we employed the energy slit to be ±20 eV to select kinetic energy ranges of secondary ions from 80 to 120 eV by loading a sample offset voltage of −100 V. The pressure during measurements was 6.5–8.0 × 10−8 Pa. Secondary ion images of 1H+, 28Si+, and 40Ca were obtained sequentially in the following order; 28Si+, 1H+, 28Si+, 1H+, 28Si+, and 40Ca+. Accumulation time was 500 and 100 s in each image, and two and three images were combined to calculate concentration maps for 1H+ and 28Si+, respectively.
Hydrogen concentration in the quenched silicate melt was quantified from the 1H/28Si intensity ratio using a calibration curve established by three silicate glasses with known H2O concentrations (0.00–4.5 wt%)49 (Supplementary Fig. 7). The analyses of these standards provide a linear relation between the count and known 1H/28Si ratios; a correlation coefficient R2 = 0.996. The detection limit of H2O is 15 ppm from its y-intercept. These standards were measured before, during, and after the analysis of each DAC sample. In order to reduce statistical errors for each DAC sample, regions of interest (ROIs) were selected on the quenched silicate melt. Combining the 1H/28Si intensity ratio with the Si content obtained by a field-emission-type electron probe micro-analyzer (FE-EPMA, see below), hydrogen (water) concentration in silicate melt was determined with ±2% to ±7% uncertainty, depending on its abundance (Supplementary Table 1).
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