Scanning Vibrating Electrode Technique (SVET) Measurement

KQ Ke Qiao
TZ Ting Zhang
KW Kuaishe Wang
SY Shengnan Yuan
SZ Shengyi Zhang
LW Liqiang Wang
ZW Zhi Wang
PP Pai Peng
JC Jun Cai
CL Chaozong Liu
WW Wen Wang
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The SVET samples were cut from BM, and SZ of the FSP and FSP-ZrO2 samples with a dimension of 8 μm × 8 μm. After grinding and polishing, they were tested on the Princeton VersaSCAN instrument. The measurements were performed in SBF and at an OCP. The scanning range was 600 μm × 600 μm, the scanning speed was 10 μm/s, and the process combined surface scanning and line scanning. The SVET samples were immersed for 1, 3, 6, and 24 h, respectively. The statistical analysis of SVET data was carried out with Origin software. The voltages were displayed in a three-dimensional (3D) maps, which showed the spatial distribution of the voltage as a function of the (x, y) position in the scan region. The voltage value in the SVET map is positive for anodic currents and negative for cathodic currents. The contour map of the voltage was located at the bottom of the 3D map.

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