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Atomic force microscope (AFM) imaging

LW Ling-Ling Wang
JC Jian-Tao Chen
LW Long-Fei Wang
SW Sha Wu
GZ Guang-zhao Zhang
HY Han-Qing Yu
XY Xiao-dong Ye
QS Qing-Shan Shi
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AFM (Park Systems, XE-100) images were obtained to characterize the morphology of the γ-PGA-H and γ-PGA-Na forms. Approximately 2 drops of the γ-PGA-H or γ-PGA-Na solution (0.01 g/L) were applied to a clean mica sheet and spin-coated (3000 rev/min) for 60 s in air. After the mica sheet dried, AFM images were acquired using a Park Systems microscope (XE-100) operating in non-contact mode at scanning rates of 0.3 or 0.5 with an image resolution of 256 by 256. The Silicon cantilever (PPP-NCHR, Nanosensors) used in the AFM was carried out with a spring constant of 42 N/m and resonance frequency of 330 kHz.

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