3D-SIM microscopy

NP Nikhil J. Pandya
FK Frank Koopmans
JS Johan A. Slotman
IP Iryna Paliukhovich
AH Adriaan B. Houtsmuller
AS August B. Smit
KL Ka Wan Li
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Imaging was performed using a Zeiss Elyra PS1 system. 3D-SIM data was acquired using a 63 × 1.4NA oil objective. 488 nm, 561 nm, 642 nm, 100 mW diode lasers were used to excite the fluorophores together with respectively a BP 495–575 + LP 750, BP 570–650 + LP 750 or LP 655 emission filter. For 3D-SIM imaging a grating was present in the light path. The grating was modulated in 5 phases and 5 rotations, and multiple z-slices were recorded with an interval of 110 nm on an Andor iXon DU 885, 1002 × 1004 EMCCD camera. Raw images were reconstructed using the Zeiss Zen software.

Reconstructed 3D-SIM images were analyzed with imageJ47 extended in the FIJI framework48. Particles larger than 10 pixels were detected and marked as region of interest (ROI) and mean ADGRA1 or PLEKHA5 signals inside the ROIs were measured. A HOMER1 particle was counted as positive for ADGRA1 or PLEKHA5 if their mean intensity was more than three times above their respective local backgrounds.

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