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2.5. Electron and Atomic Force Microscopy

AZ Anna A. Zykova
EB Elena A. Blokhina
RK Roman Y. Kotlyarov
LS Liudmila A. Stepanova
LT Liudmila M. Tsybalova
VK Victor V. Kuprianov
NR Nikolai V. Ravin
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Purified proteins were examined in a transmission electron microscope, JEM 100CXII (JEOL, Tokyo, Japan). For atomic force microscopy, an Integra Prima microscope and Nova SPM software (NT-MDT, Moscow, Russia) were used. Scanning was performed in semicontact mode using a 35 nm gold cantilever, NSG01 (NT-MDT). The protein sample was applied to a sapphire substrate, coated with mica and dried at room temperature. PBS was used as a negative control.

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Licensee MDPI, Basel, Switzerland. This article is an open access article distributed under the terms and conditions of the Creative Commons Attribution (CC BY) license (http://creativecommons.org/licenses/by/4.0/).

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