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Imaging of functionalized surface by atomic force microscopy
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Atomic force microscopy (AFM) imaging of the studied surfaces was carried out using an Agilent (Santa Clara, CA, USA) 5500 microscope operating in a non-contact mode. For analysis, AFM tips with constant elasticity of 2 N/m, apex radius < 7 nm, and resonance frequency of about 70 kHz were used. For all samples, the average height distribution in the AFM image and the doubled width in the middle of the maximum radial-averaged function as the AFM height and the size of the feature were adopted.
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