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Silicon sample holders were utilized to get diffraction patterns for pure ZFN and cocrystals (Bruker D8 Advance diffractometer). The instrument was equipped with a fine focus X-ray tube and each sample was placed onto a goniometer head that was motorized to permit spinning of the sample during data acquisition.
Copyright and License information: ©2019 Turk J Pharm Sci, Published by Galenos Publishing House.
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