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The crystal structure of the prepared films was examined by X-ray diffraction (XRD)—X’pert-PRO PANalytical with Cu Kα radiations (1.5418 Å). The surface morphology and compositional analysis of the films were determined using a scanning electron microscope (SEM)—Ultra55 FE-SEM Karl Zeiss—EDS. Thickness of the films were measured by cross-sectional SEM. Atomic force microscopy (AFM) was carried out using A.P.E. Research A100-AFM. Raman analysis was done using LabRAM HR equipped with a 532 nm laser.
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