Optical Microscopy

For the concurrent tracking of the AFM images, a corresponding optical microscopic image of the pillars was also acquired. These optical images guided the navigation of the AFM measurements between different regions (Leica DM2700 M). Pattern formation in thin polymer films was qualitatively analyzed using bright-field reflection microscopy (Olympus Optical Microscopes GX61, GX2, and BX40). The reflection of white light from the sample enabled resolving the submicron-scale features. The evolving patterns were also observed by in situ monitoring of the EFDP pattern formation and replication in thin films using a digital camera and imaging software (Carl-Zeiss VisioCam, AxioVision).