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Determination of the particle morphology by scanning electron microscopy (SEM)
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The microcapsules were analyzed using a scanning electron microscope in order to examine the external appearance of the particles. All specimens were prepared by mounting to the carbon conductive adhesive tape on SEM stub holder then sputtered with gold coating in a Hummer IV sputter coater. SEM photographs were taken by the scanning electron microscope (JEOL, JSM-IT300 InTouchScopeTM, USA) at a magnification 100x to 10,000x, at room temperature, equipped with an X-ray detector model with an operating of 10 kV.
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