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Transmission Electron microscopy (TEM)

SM Sivakumar Murugadoss
FB Frederic Brassinne
NS Noham Sebaihi
JP Jasmine Petry
SC Stevan M. Cokic
KL Kirsten L. Van Landuyt
LG Lode Godderis
JM Jan Mast
DL Dominique Lison
PH Peter H. Hoet
SB Sybille van den Brule
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TEM specimens of stock suspensions were prepared and examined using a well-aligned Tecnai Spirit microscope (FEI, Eindhoven, Netherlands) operating at 120 kV, at a spot size 3 and imaged in BF-mode in parallel beam conditions. Images were typically recorded at approximately 500 nm below minimal contrast conditions. Digital micrographs were made using the bottom-mounted 4 × 4 K Eagle CCD-camera and converted to tif-format using the TIA software. Equivalent circle (ECD) and Feret minimum diameter (Feret min) analyses were performed as described in [45].

Copyright and License information: The Author(s) ©2020
Open AccessThis article is distributed under the terms of the Creative Commons Attribution 4.0 International License (http://creativecommons.org/licenses/by/4.0/), which permits unrestricted use, distribution, and reproduction in any medium, provided you give appropriate credit to the original author(s) and the source, provide a link to the Creative Commons license, and indicate if changes were made. The Creative Commons Public Domain Dedication waiver (http://creativecommons.org/publicdomain/zero/1.0/) applies to the data made available in this article, unless otherwise stated.

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