AFM phase imaging

BL Baoyang Lu
HY Hyunwoo Yuk
SL Shaoting Lin
NJ Nannan Jian
KQ Kai Qu
JX Jingkun Xu
XZ Xuanhe Zhao
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AFM phase images and surface roughness data were acquired by atomic force microscope (MFP-3D, Asylum Research). Dry-annealed free-standing PEDOT:PSS films were directly attached onto sample stage by double-sided carbon tape.

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