For the force measurements, AFM tests were performed on a Bruker MultiMode 8 by using PFQNM mode at room temperature. The spring constant (k, N/m) of the cantilever was measured by thermal tune method. Sensitivity (S, nm/V) of the cantilever, as the cantilever deflection signal vs. the voltage applied to the Z-Piezo, was calibrated on a sapphire surface. The tip radius was evaluated by testing on the standard PDMS sample. The force applied on the sample can be defined as:
Where ∆Z(V) is the amplitude of cantilever bending.
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