X‐ray diffraction analysis

FM Felix G. Marx
AC Alberto Collareta
AG Anna Gioncada
KP Klaas Post
OL Olivier Lambert
EB Elena Bonaccorsi
MU Mario Urbina
GB Giovanni Bianucci
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Some phosphatic material was manually collected with a needle and powdered for X‐ray powder diffraction analysis (XRPD), using a Bruker D2 Phaser diffractometer operating at 10 mA and 30 kV, a flat background‐free sample holder, and Cu Kα1 radiation with λ = 1.54060 Å. Data were processed using the software DIFFRAC.EVA V4.1, and the peaks indexed on the basis of fluorapatite with a hexagonal unit cell (a = 9.3465, c = 6.8928 Å).

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