3.3. Characterization Tehcniques

The sample surface was characterized with a field emission scanning electron microscope (FE-SEM, ZEISS ultra plus, Jena, Germany) with energy dispersive spectrometer (EDS, Oxford Instruments INCA Energy 350, Abingdon, UK) using a 15.0 kV acceleration voltage. The EDS results were taken as average values from three separate points on the sample surfaces. FTIR (Bruker Tensor 27, Billerica, MA, USA) with attenuated total reflection (ATR) diamond sample holder and DLaTGS detector was used to analyse the composition of the nanowires in the spectral range of 3950–400 cm⁻¹. The FTIR measurements were done directly from the sample surface. X-ray photoelectron spectroscope (XPS) (PHI Quantum 2000, Chanhassen, MN, USA) was used for the surface elemental analysis. A monochromated Al Kα beam (50 W, 15 kV) with a 200 µm spot size was used to obtain the C 1s spectrum. Mild sputtering of the sample surface was performed with Ar⁺ ions. The C 1s peak at 285.0 eV was used for the charge-shift correction.