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Surface characterization of titanium
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The morphologies of the four different titanium surfaces were detected by field emission scanning electron microscopy (FE-SEM; S-4800; Hitachi Limited, Tokyo, Japan) according to previous studies.27,28 The measurement of titanium surface roughness was performed by the Micro-XAM-3D noncontact surface profiler (ADE Corporation, Westwood, MA, USA) in a noncontact mode. Two roughness parameters of the measurement at S, R, R10, and R20 titanium disks were as follows: average roughness (Ra) and root mean square roughness (Rq).
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