X-ray diffraction (XRD) analysis

AA Amutha Arul
PR Priya Rana
KD Kiran Das
IP Ieshita Pan
DM Debasish Mandal
AS Adele Stewart
BM Biswanath Maity
SG Soumyajit Ghosh
PD Priyadip Das
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The PXRD pattern of the samples was recorded by using a PANalytical X'Pert Pro Powder X-ray diffractometer. Data collection was carried out at room temperature using Cu Kα radiation (1.5406 Å; 40 kV, 30 mA) as the X-ray source in 2θ continuous scan mode (Bragg–Brentano geometry) in the range of 5–30° at a scan rate of 1° min−1 and a time per step of 0.5 s.

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