The PXRD pattern of the samples was recorded by using a PANalytical X'Pert Pro Powder X-ray diffractometer. Data collection was carried out at room temperature using Cu Kα radiation (1.5406 Å; 40 kV, 30 mA) as the X-ray source in 2θ continuous scan mode (Bragg–Brentano geometry) in the range of 5–30° at a scan rate of 1° min−1 and a time per step of 0.5 s.
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