2.3. Scanning Electron Microscopy (SEM) and ImageJ

Before testing, samples were sputter-coated with a gold ion beam for 100 s tests to enhance electrical conductibility. In this study, the samples were taken using scanning electron microscopy (SEM, Phenom Pure, Shanghai, China) to capture surface topography images.

The polyurea material was stretched using a universal stretching machine to obtain the tensile fracture morphology image of the specimen after the tensile test. The size and quantity of holes produced after the polyurea material was stretched were measured using ImageJ software (ImageJ is a public image processing software based on java) in the tensile fracture morphology image. The statistics are displayed in Figure 3.

One of the polyurea tensile fracture holes and pore sizes analyzed by ImageJ.