3.5. TEM, SAED, and EDS Measurements

NN Natsumi Noguchi
SI Shin-ichi Ito
MH Miwa Hikichi
YC Yohei Cho
KG Kazuho Goto
AK Atsushi Kubo
IM Iwao Matsuda
TF Takeshi Fujita
MM Masahiro Miyauchi
TK Takahiro Kondo
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Measurements were performed at room temperature using a JEM-2100F TEM/STEM apparatus (JEOL, Ltd., Japan) with double spherical aberration (Cs) correctors (CEOS GmbH, Heidelberg, Germany) to obtain high-contrast images with a point-to-point resolution of 1.4 Å. The lens aberrations were optimized by evaluating the Zemlin tableau of amorphous carbon. The residual spherical aberration was almost zero (Cs = −0.8 ± 1.2 μm with 95% certainty). The acceleration voltage was set to 120 kV, which is the lowest voltage that is effective with the Cs correctors in this system.

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