The CD data were obtained by scanning at a far-UV range (190–280 nm) using a Chirascan Circular Dichroism spectrometer (J-1500, JASCO, Tokyo, Japan) with a 2 mm path-length quartz cuvette at 20 °C. The scanning speed was 500 nm per 1 min. The samples used for circular dichroism analysis were carrier material (PLL) and NPs (PLL/MTX NPs). The CD data were expressed in terms of ellipticity (θ).
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