X-ray diffraction (XRD)

The phase analysis and lattice parameters of all NPs were studied by powder XRD using a Panalytical Empyrean (Cu Kα radiation) diffractometer over a 2θ range of 10°–80° with a step size of 0.026°. For measurements, the powder was placed on a standard sample holder and measured in reflection mode (Bragg-Brentano geometry). The background parameters, zero shift and detector shifts, lattice parameters and atomic coordinates for the host and doping atoms, and profile parameters (Pseudo-Voight function including crystallite size, and strain parameters) were fitted simultaneously using the Rietveld refinement procedure realized in the High Score Plus software.