A Malvern Nano ZS detector (Malvern Instruments, Malvern, England) was used to measure the particle size, PDI and zeta potential of NPs according to the principle of DLS. The reported NP formulation values are presented as mean ± standard deviation of the lowest three individual measurements for each sample.
The NP morphology was investigated using TEM and SEM. For TEM, the NP suspension was deposited on a copper grid and dried in a desiccator. Subsequently, the morphology of each group of the NPs was observed under HT7800 TEM (Hitachi, Japan), and the images were acquired.
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