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2.6.2. X-ray Diffraction (XRD)

JV Joseph Merillyn Vonnie
CL Chua Shek Li
KE Kana Husna Erna
KY Koh Wee Yin
WF Wen Xia Ling Felicia
MA Md Nasir Nur’ Aqilah
KR Kobun Rovina
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The XRD analysis was carried out to observe the CS/ESP/OPAC film’s possible crystalline structure. The crystal structures of the CS/ESP/OPAC film were studied using diffraction patterns acquired on an X-ray diffractometer Rigaku Smartlab XRD/6000 (Austin, TX, USA). The crystallinity index (CI) of CS/ESP/OPAC film was calculated based on the calculus of crystallinity area (Ac) and amorphous area (Aa) in a diffractogram using the following equation [36].

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