Spectroscopic Ellipsometry

PK Pascal Kaienburg
* *
HB Helen Bristow
AJ Anna Jungbluth
IH Irfan Habib
IM Iain McCulloch
DB David Beljonne
MR Moritz Riede
ask Ask a question
Favorite

Spectroscopic ellipsometry was carried out with a Woollam RC2 spectroscopic ellipsometer at 55, 65, and 75° angles of incidence. Single-component films on glass were prepared in a similar fashion to the devices. The acquired ψ and Δ spectra were model-fitted with the CompleteEASE software from J.A. Woollam company to obtain the optical constants n and κ. Using B spline models, anisotropic fits were performed, yielding in-plane and out-of-plane components and the results were confirmed by matching transmission data.

Do you have any questions about this protocol?

Post your question to gather feedback from the community. We will also invite the authors of this article to respond.

post Post a Question
0 Q&A