Single-Crystal X-Ray Diffraction

SC-XRD datasets were collected at the beamline 12.2.1 at the Advanced Light Source (Lawrence Berkeley National Laboratory, USA) using a radiation wavelength of λ = 0.7288 Å. Beamline 12.2.1 is equipped with a PHOTON-II CMOS detector operating in shutterless mode and a Si(111) monochromator. For the measurement, the crystalline sample was mounted on a Kapton MiTeGen MicroMount in a minimal amount of Paratone N oil and submerged in a cold gas stream generated by an Oxford Cryosystems 800 Series Cryostream.