3.3. Scanning Electron Microscopy (SEM) and Energy Dispersive X-ray Analysis (EDX)

Scanning electron microscopy (SEM) was performed using an FEI Quanta 200 ESEM microscope, operating at 20 kV on specimens from which a thin layer of gold had evaporated. On the other hand, an electron microprobe used in an energy dispersive mode (EDX) was employed to obtain information on the actual metal-content ratio present in the samples.