Scanning electron microscopic (SEM) analysis

ME Mostafa El-Sheekh
ME Mostafa Elshobary
EA Eman Abdullah
RA Refat Abdel-Basset
MM Metwally Metwally
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SEM analysis was used to analyze the morphological and micro-structural variations of the treated and untreated samples using SEM (Tescan vega 3 SBU, Czech Republic) at an accelerating voltage of 220 keV. The samples were displayed on aluminum microscopy stubs using carbon tape, then covered with a thin layer of gold (Au) for 120 s using Quorum technique Ltd, sputter coater (Q150t, England) [93].

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