Characterization

The crystallographic phase identification of the film was carried out using Bragg – Brentano (B-B) X-ray diffractometer operated at 40 keV using monochromatic Cu Kα radiation (λ = 1.5406 Å) with a scan rate of 2° per minute and at a step size of 0.02° (Rigaku Ultima IV, Japan). The pole figure analysis was carried out using high resolution x-ray diffraction technique (HR-XRD, D8 Advance, Bruker, Germany) by rotating the goniometer in both Ψ (0 to 90°) and ϕ (0 to 360°) direction. The recorded pole figure was processed using MTEX tool in Matlab software to quantify the orientation distribution function (ODF)⁴¹. Raman spectra were recorded in the range of 200 to 800 cm⁻¹ at room temperature using confocal Raman spectrometer (Renishaw, UK) with a laser excitation wavelength of 514 nm and the acquisition time was maintained for 30 s. The surface morphology and cross-sectional view of the thin film were examined by a Field Emission-Scanning Electron Microscope (FE-SEM) with Carl Zeiss Ultra 55.

To analyze the electrical properties of the films, in-plane conductivity measurement were carried out with two-probe configuration using Novacontrol impedance analyzer (Alpha-A). Two parallel platinum electrodes were attached to the films by applying the platinum paste and conductivity was measured out in the air as a function of temperature from 400 to 850 °C at an interval of 50 °C. A soaking time of 20 minutes was provided at each temperature before beginning the impedance measurement. During the impedance measurement, a bias voltage of 1 V was constantly applied while sweeping the frequency from 1 Hz to 1 MHz.