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2.8. The Particle Surface Morphology Analysis Using Transmission Electron Microscopy (TEM)

MK Magdalena Kędzierska
AD Anna Drabczyk
MJ Mateusz Jamroży
SK Sonia Kudłacik-Kramarczyk
MG Magdalena Głąb
PP Piotr Potemski
BT Bożena Tyliszczak
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The particle surface morphology was analyzed using transmission electron microscopy. For this purpose, a JEOL JEM1200 (JEOL USA Inc., Peabody, MA, USA) transmission electron microscope was used. TEM images were recorded using an accelerating tension of 120 kV.

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