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2.3.6. Atomic Force Microscope (AFM)
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A Shimadzu AFM-9700 (Shimadzu Corporation, Kyoto, Japan) atomic force microscope operated in the tapping mode was used to analyze surface roughness and morphology changes of CFs. In the experiment, one single filament of CFs was fixed on a glassy board using double-sided tape and it was detected by a silicon nitride probe. The obtained images were in a 5.0 μm × 5.0 μm area with a height of 190 nm.
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