2.2.7. Powder X-ray Diffraction (PXRD)

An X-ray diffractometer (XRD, PANAlytical Empyrean) was used to record PXRD diffraction patterns for the determination of the presence of crystals in filaments, 3D-printed coatings, and extrudates. It was an X-ray diffractometer (XRD, PANAlytical Empyrean) with Cu-tube and pixcel 3D scintillator detector in the range of 5–65° 2Theta (step size 0.026°) and Bragg–Brentano geometry. For the powder sample, the standard powder sample holder was used. For 3D-printed samples and filaments, the XYZ stage was used. The programmable divergence slit was used to maintain a constant irradiated length of the sample.