Synchrotron radiation micro-beam X-ray fluorescence spectrometry (μ-XRF) and X-ray absorption fine structure (XAFS) analysis

μ-XRF experiments were carried out on the BL15U beamline station at the SSRF (Shanghai Synchrotron Radiation Facility). Monochromatic light was obtained using a Si (111) double crystal and then focused to a specified beam size using a K-B mirror. A silicon drift detector (SDD) was used to record the characteristic fluorescence spectra of elements in the samples. Samples were mounted on a stage, which can drive the sample step by step with a step resolution of 3 μm.

The X-ray absorption fine structure spectra were carried out on the BL14W station at the SSRF. Monochromatic light was obtained using a Si (111) double crystal monochromator, with a scanning energy step of 0.5 eV. The XAFS spectra were recorded with fluorescence mode using 4-elements SDD. A filter was placed between the detector and the sample to suppress light scattering.