Scanning electron microscopy (SEM)

BH Basma Hashmi
TM Tadanori Mammoto
JW James Weaver
TF Thomas Ferrante
AJ Amanda Jiang
EJ Elisabeth Jiang
JF Juani Feliz
DI Donald E. Ingber
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Backscattered scanning electron (BSE) imaging and elemental mapping was performed on two environmental SEMs (Tescan VegaGMU and Tescan MiraGMU, Brno Czech Republic) equipped with energy dispersive spectrometers (Bruker Nano X-Flash, Billereca, Massachusetts, USA).

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