2.6. Volatile Compounds (VOCs)

MM Maria Martuscelli
LE Luigi Esposito
DM Dino Mastrocola
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The experimental plan was designed to have triplicate samples of each formulation of T0 cooked samples, T72 and T120 samples. Cooked samples T0 were immediately chopped and put in glassy vials of 20 mL capacity (Perkin Elmer, Waltham, MA, USA) with approximately 3 g of meat each, tightly closed and stocked at −40 °C, assuring the highest headspace, until gas chromatograph mass spectrometer (GC-MS) analysis. GC-MS analysis was performed with a gas chromatograph (Clarus 580, Perkin Elmer, Waltham, MA, USA) coupled with a mass spectrometer (SQ8S, Perkin Elmer Waltham, MA, USA). Other samples were left in refrigerated conditions for the time required to obtain T72 and T120, then carefully chopped and stocked in 20 mL vials at −40 °C, until GC-MS analysis.

The GC-MS analysis followed the method proposed by Qi et al. [18] with some modifications. Vials were left for 1 h at room temperature, then put in a water bath at 50 °C for 20 min. Volatiles from meat were extracted with a headspace solid phase microextraction fibre (SPME 65 μm Polydimethylsiloxane/Divinylbenzene (PDMS/DVB); Supelco, Bellofonte, PA, USA) and collected for 30 min at 40 °C, then inserted into the GC injector and desorbed for 3 min at 250 °C. Volatile compounds were separated on a Capillary GC column ZB- Semi Volatiles (30 m length, 0.25 mm internal diameter, 0.25 μm film thickness: Phenomenex, Torrance, CA, USA). The oven temperature was maintained for 3 min at 40 °C, increased at 3 °C/min to 70 °C, then at 5 °C/min to 180 °C, then at 10 °C/min to 260 °C, and maintained for 5 min at 260 °C. Helium was the carrier gas with a constant flow of 1 mL/min. The mass-selective detector was operated in the electron impact mode (70 eV) and full scan mode (35–500 m/z range). The identification was performed using the National Institute of Standards and Technology mass spectral library (NIST Mass Spectral library, Search Program version 2.0, National Institute of Standards and Technology, U.S. Department of Commerce, Gaithersburg, MD, USA).

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