Scanning electron microscopy images were acquired with a high resolution Magellan 400L SEM. The field emission gun was operated at an accelerating voltage of 5 kV and gun current of 6.3 pA. Images were obtained in secondary electron detection mode using an immersion lens and TLD detector. A 3–5 nm platnium coating was sputtered (Emitech sputter coater) on to the surface of the h-BN flakes to reduce the build-up of electrons.
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