A field emission scanning microscope (SEM; S-8020, Hitachi High-Technologies Corp., Japan) equipped with energy dispersed X-ray spectroscopy (EDS) was used for evaluation of particle size and elemental composition. A transmission electron microscope (TEM; JEM-2100F, JEOL Ltd., Japan) equipped with EDS and scanning TEM mode (STEM) was employed at an operating voltage of 200 kV to clarify the crystal phase and elemental composition of individual particles. Powder X-ray diffraction (XRD) (SmartLab, Rigaku Corp., Japan) using Cu Kα radiation (λ = 0.1544 nm) equipped with one dimensional detector was used to characterize crystal phases of samples. X-ray photoelectron spectrometer (XPS) analyses were carried out with ESCA-5600 (Ulvac-Phi, Japan) using a monochromatic Al Kα source (1486.6 eV, 200 W) to evaluate an elemental composition of adjacent surface of particles and an oxidation state of Ti and Nb atoms. The instrument work function was calibrated to give an Au 4f7/2 of metallic gold binding energy of 83.95 eV ± 0.1 eV. Survey spectra and high-resolution spectra were collected with a step of 0.4 and 0.05 eV, respectively. The obtained spectra were calibrated using C 1 s binding energy (284.8 eV) of the samples as an internal standard. Ultraviolet–visible (UV–Vis) spectroscopy (V-650 spectrophotometer, JASCO Corp., Japan) equipped with an integrating sphere was used to characterize optical band gap of samples and evaluation of decolorization of MO solution. The reflectance values of obtained diffuse reflectance spectra were transformed to Kubelka–Munk units, F(R∞) by using Eq. (1)
where is measured reflectance value. Raman spectroscopy (RAMANtouch, Nanophoton Corp., Japan) was employed to characterize crystal phases and defects (excitation: 532 nm). The N2 adsorption–desorption measurement using Belsorp-18 (Bel Japan Inc., Japan) was employed to evaluate specific surface area by the Brunauer–Emmett–Teller (BET) method.
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