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2.2.2. Field-Emission Scanning Electron Microscopy (FESEM)

MB Mihaela-Cristina Bunea
VD Victor-Constantin Diculescu
ME Monica Enculescu
HI Horia Iovu
TE Teodor Adrian Enache
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The morphology of the samples was investigated using a Gemini 500 Carl Zeiss field-emission scanning electron microscope (FESEM) working in both high-vacuum (HV) and variable-pressure (VP) modes from 0.2 to 30 kV, equipped with LaB6 filament, InLens and SE2 detectors, NanoVP mode, and a Bruker QUANTAX 200 energy-dispersive X-ray spectrometer (EDS) with an XFlash®6 silicon drift detector (SDD), an energy resolution <129 eV at Mn-Ka, and Peltier cooling. The above setup was used to investigate the elemental compositions of the samples.

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