In situ cryo-FIB/SEM Specimen Preparation Using the Waffle Method

用华夫饼法原位制备冷冻双束电镜FIB/SEM的样品

 (*contributed equally to this work) 发布: 2022年11月05日第12卷第21期 DOI: 10.21769/BioProtoc.4544 浏览次数: 5129

评审: Manjula MummadisettiVignesh KasinathAnonymous reviewer(s)

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