The XRD diffractograms were taken from Pan analytical X-Ray diffractometer with scanning range of 20 to 80 degree with scanning speed of 48 per min, using Cu Ka radiation. The surface morphology and the crystallite size were obtained from Scanning Electron Microscope (SEM) HITACHI S–2400, Japan and Transmission Electron Microscopy (TEM), H7500, Hitachi Ltd., Japan at 120 kV respectively. FTIR spectra were recorded in the range of 2000–1200 cm2 using Nicolet-170 SX FT-IR spectrophotometer. The hydrodynamic size and the surface charge were obtained at room temperature from dynamic light scattering measurements using Malvern-DTS Ver 4.20.

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