The SPCM was carried out at room temperature in a confocal microscope setup with an objective with a numerical aperture of 0.8. The excitation was provided by a focused laser of a given wavelength (532 nm) and by a supercontinuum white light source (Fianium Ltd) combined with a monochromator for the high-resolution spectra (450 nm ≤ λ ≤ 2000 nm) where λ is the wavelength. During the wavelength scanning, photocurrent is measured by a lock-in technique with a chopper frequency of 500 Hz and subsequently normalized to the photon flux. The chopped laser beam is focused by a microscopic lens (numerical aperture, 0.8) and illuminates the QD/a-IGZO channel and S/D electrode region of devices (32). For the noise measurement, the noise power spectral densities were measured with an SR 570 low–noise current preamplifier (Stanford Research System, Sunnyvale, CA, USA) and an Agilent 35670A dynamic signal analyzer (Agilent Co.).

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