Scanning probe microscopy measurements
This protocol is extracted from research article:
A room-temperature ferroelectric semimetal
Sci Adv, Jul 5, 2019; DOI: 10.1126/sciadv.aax5080

The scanning probe microscopy measurements were implemented on a commercial AIST-NT SmartSPM 1000 atomic force microscope at room temperature in an inert atmosphere (i.e., controlled N2 environment). The PFM measurements were performed at an AC imaging bias of 1 V (peak to peak) and a frequency of approximately 700 kHz. The spectroscopic piezoresponse hysteresis loops were acquired at fixed spatial locations by supplying a triangular DC waveform with a superimposed low-amplitude AC modulation.

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