To gain more insight into the lead white stratigraphy of the painting, the two cross-sectioned samples (described above) were analyzed with μ-XRPD. The samples were analyzed at beamline P06 (PETRA III, DESY, Germany), a hard x-ray micro- and nanoprobe beamline suited for XRPD imaging experiments on the microscale. A Kirkpatrick-Baez optical system focuses the beam to a diameter of 0.5 μm and a flux of 1010 photons s−1 with a primary energy of 21 keV. The samples were placed in a sample holder that could be moved in the XYZ dimensions across several millimeters. An EIGER X 4M detector (DECTRIS Ltd., Germany) was used to collect the diffraction signals. The sample was placed at a distance of 18 cm in front of the detector, ensuring a sufficiently wide angular range. The collected diffraction data were corrected for attenuation effects.

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