Ultrathin sections of the repaired enamel for TEM characterization of the structure and crystallography were prepared with a dual-beam focused ion beam (FIB)–scanning electron microscope instrument (Quanta 3D FEG, FEI, USA), which was fitted with a liquid gallium ion source. A layer of platinum (thickness, ~1 μm) was deposited over a region of interest to protect the surface from ion beam damage during the milling processes. The thin sections were lifted out and transferred onto a copper grid for further TEM and SAED observations.

Note: The content above has been extracted from a research article, so it may not display correctly.

Please log in to submit your questions online.
Your question will be posted on the Bio-101 website. We will send your questions to the authors of this protocol and Bio-protocol community members who are experienced with this method. you will be informed using the email address associated with your Bio-protocol account.

We use cookies on this site to enhance your user experience. By using our website, you are agreeing to allow the storage of cookies on your computer.