AFM characterization was carried out in soft tapping mode in air on Bruker Dimension FastScan. TEM images were obtained on a Hitachi H-800 instrument at 175 kV. The silica microparticles were dropped on a carbon-coated TEM grid and dried in air. XPS measurement was performed by using a PREVAC XPS/UPS System. FT-IR spectra were recorded on a Bruker VERTEX 80v spectrometer. All spectra were collected at an accumulation of 32 scans with 4-cm−1 resolution. The proton nuclear magnetic resonance (1H NMR) spectra were recorded at 500 MHz on a Bruker AVANCE 500 spectrometer at room temperature.

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