The surface reflectance spectra in Fig. 1I were measured at normal incidence and reflection from the tape side or the microsphere side of the RSCF using a fiber optic spectrometer (PG2000-Pro-EX, Ideaoptics Technology Ltd., China) equipped with a Y-shaped coaxial optical fiber bundle. The angle-resolved reflectance spectra in Fig. 2 (E and H) and the reflectance intensity in Fig. 3 (A to F) were measured using an angle-resolved spectrometer (R1, Ideaoptics Technology Ltd., China).

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