YbTM2Zn20 single-crystals were characterized structurally by single-crystal XRD using an Oxford-Diffraction Xcalibur2 CCD system with graphite monochromated Mo Kα radiation. Data were collected using ω scans with 1° frame widths to a resolution of 0.4 Å, equivalent to 2θ ≈ 125°. Reflections were recorded, indexed, and corrected for absorption using the Oxford-Diffraction CRYSALISPRO software (37), and subsequent structure determination and refinement were carried out using the single-crystal x-ray structure refinement and analysis software package CRYSTALS (38), with SUPERFLIP (39) phasing algorithm on F2. The data quality allowed an unconstrained full matrix refinement against F2 with anisotropic thermal displacement parameters for all atoms. The crystallographic information files have been deposited with the Inorganic Crystal Structure Database (ICSD CSD-434009, CSD-434010, and CSD-434011 for YbCo2Zn20, YbRh2Zn20, and YbIr2Zn20, respectively). Electron-dispersive spectroscopy analyses corroborated the stoichiometries obtained from the refinement results.

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