Graphene samples with a carbon buffer layer were epitaxially grown on commercial 6H-SiC substrates. The substrates were hydrogen etched before the growth under argon atmosphere. Details are described by Forti and Starke (47). AFM characterization measurements were taken at the Max Planck Institute in Stuttgart. Adhesion images correspond to the force necessary to retract the tip from the sample. Adhesion is sensitive to the graphene coverage on the sample and can thus distinguish between zero layer, monolayer, and bilayer graphene with sensitivity to grain boundaries.

Note: The content above has been extracted from a research article, so it may not display correctly.



Q&A
Please log in to submit your questions online.
Your question will be posted on the Bio-101 website. We will send your questions to the authors of this protocol and Bio-protocol community members who are experienced with this method. you will be informed using the email address associated with your Bio-protocol account.



We use cookies on this site to enhance your user experience. By using our website, you are agreeing to allow the storage of cookies on your computer.