UV-Vis-NIR–polarized reflectance measurements
This protocol is extracted from research article:
Shear-solvo defect annihilation of diblock copolymer thin films over a large area
Sci Adv, Jun 14, 2019; DOI: 10.1126/sciadv.aaw3974

UV-Vis-NIR spectral behavior was obtained using a PerkinElmer LAMBDA 950 two-beam spectrometer with a Cary 5000 detector (Agilent) with an integrating sphere. The incident light was introduced perpendicular to the substrate; the spectral region was 320 to 1080 nm, but data were only shown at the range of 350 to 850 nm because of the detector sensitivity.

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